Achieving 100% Cell-aware Coverage by Design

This paper was presented at the Design, Automation & Test in Europe Conference & Exhibition (DATE), 2016.

Authors: Zeye Liu, Ben Niewenhuis, Soumya Mittal, R. D. Blanton

Summary: Prior work proposed a novel logic characterization vehicle called the Carnegie Mellon Logic Characterization Vehicle (CM-LCV), and an implementation flow that ensures a test chip to be product-like with near optimal testability and diagnosability. This work describes an enhanced implementation methodology for CM-LCV that not only guarantees 100% intra-cell defect testability for all standard cells but also reflects the user-specified design characteristics.

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