An Automated Methodology for Logic Characterization Vehicle Design
This paper is published in the Electronic Design Failure Analysis (EDFA) Magazine, ASM International, Feb 2019
Authors: Zeye Liu, Ben Niewenhuis, Soumya Mittal, Phillip Fynan, Shawn Blanton
Summary: A new product-like test chip called the Carnegie Mellon Logic Characterization Vehicle (CM-LCV) is introduced to address the challenges facing conventional product-like test chips. The CM-LCV implements a highly testable two-dimensional array of functional unit blocks that reflects the properties of product designs, resulting in an optimized test chip for yield learning.
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