Soumya Mittal

Staff Engineer
Yield and Diagnostics
Qualcomm Technologies Inc.
CMU PhD
IIT Rookee B.Tech

Doctoral Thesis Award

I participated in the 2019 TTTC’s E.J. McCluskey Best Doctoral Thesis Award, which was held at the IEEE VLSI Test Symposium (VTS), Monterey, CA, USA. The purpose of the competition is to promote the most impactful work in the field of test technology. I was adjudged a semifinalist in this contest.

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Integrated Circuit Defect Diagnosis using Machine Learning

Our patent has now officially been granted.

Machine Learning in Logic Circuit Diagnosis

Our book’s finally going to be published in Feb 2023! Pre-order it now from Amazon or Barnes & Noble. It showcases the use of different machine learning ...

Industry Evaluation of Reversible Scan Chain Diagnosis

I presented this paper at the International Test Conference (ITC), 2022.

Improving Diagnosis Resolution with Population Level Statistical Diagnosis

This paper was presented at the International Symposium for Testing and Failure Analysis (ISTFA), 2021.