Improving Diagnosis Resolution with Population Level Statistical Diagnosis
This paper was presented at the International Symposium for Testing and Failure Analysis (ISTFA), 2021.
Authors: Kun Young Chung, Shaun Nicholson, Soumya Mittal, Martin Parley, Gaurav Veda, Manish Sharma, Matt Knowles, Wu-Tung Cheng
Summary: In this paper, we present a diagnosis resolution improvement methodology for scan-based tests. This resolution improvement is achieved by considering the diagnosis problem at the level of a population (e.g., a wafer) of failing die instead of analyzing each failing die completely independently as has been done traditionally.