You may also enjoy
Machine Learning in Logic Circuit Diagnosis
Our book’s finally going to be published in Feb 2023! Pre-order it now from Amazon or Barnes & Noble. It showcases the use of different machine learning ...
Industry Evaluation of Reversible Scan Chain Diagnosis
I presented this paper at the International Test Conference (ITC), 2022.
Improving Diagnosis Resolution with Population Level Statistical Diagnosis
This paper was presented at the International Symposium for Testing and Failure Analysis (ISTFA), 2021.
Integrated Circuit Defect Diagnosis Using Machine Learning
Our patent (16/986,963) filing is published now.