Logic Characterization Vehicle Design Reflection via Layout Rewiring

This paper was presented at the International Test Conference (ITC), 2016.

Authors: Phillip Fynan, Zeye Liu, Ben Niewenhuis, Soumya Mittal, Marcin Strojwas, Shawn Blanton

Summary: A new method is proposed for constructing a CM-LCV that reflects the design characteristics of a product through rewiring either the entire layout or some portion thereof. Rewiring has many advantages including the transformation of an actual product front-end to a logic-based test chip that has significant transparency to failure. Consequently, this means that front-end masks from an actual product can be re-used to create an effective LCV that is both more reflective and inexpensive to fabricate.

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