Doctoral Thesis Award
I participated in the 2019 TTTC’s E.J. McCluskey Best Doctoral Thesis Award, which was held at the IEEE VLSI Test Symposium (VTS), Monterey, CA, USA. The pur...
Recent posts
Diagnosis Outcome Preview through Learning
This work was presented at the VLSI Test Symposium (VTS), 2019.
An Automated Methodology for Logic Characterization Vehicle Design
This paper is published in the Electronic Design Failure Analysis (EDFA) Magazine, ASM International, Feb 2019
Improving Diagnosis Efficiency via Machine Learning
This work was presented at the International Test Conference (ITC), 2018.
NOIDA: Noise-resistant Intra-cell Diagnosis
I presented this paper at the VLSI Test Symposium (VTS), 2018.