Neil and Jo Bushnell Fellowship in Engineering
I was selected (out of >800 students) to receive the prestigious 2017 Neil and Jo Bushnell Fellowship in Engineering by Carnegie Institute of Technology, ...
Recent posts
PADLOC: Physically-Aware Defect Localization and Characterization
I presented this paper at the Asian Test Symposium (ATS), 2017.
Multiple-defect Diagnosis for Logic Characterization Vehicles
This paper was presented at the European Test Symposium (ETS), 2017.
Test Chip Design for Optimal Cell-aware Diagnosability
I presented this paper at the International Test Conference (ITC), 2016.
Logic Characterization Vehicle Design Reflection via Layout Rewiring
This paper was presented at the International Test Conference (ITC), 2016.