Soumya Mittal

Soumya Mittal

Staff Engineer
Yield and Diagnostics
Qualcomm Technologies Inc.
CMU PhD
IIT Rookee B.Tech

Publications

Patents

  • Soumya Mittal, Shawn Blanton, “Integrated Circuit Defect Diagnosis Using Machine Learning”, US Patent Application No. 16/986,963, Feb 2020 Google Patents

Book Chapters and Magazines

  • Shawn Blanton, Qicheng Huang, Chenlei Fang, Soumya Mittal, “Machine Learning in Logic Circuit Diagnosis”, in Machine Learning Support for Fault Diagnosis of System-on-Chip, Springer, 2023 Amazon

  • Zeye Liu, Benjamin Niewenhuis, Soumya Mittal, Phillip Fynan, Shawn Blanton, “Automated Methodology for Logic Characterization Vehicle Design”, in EDFA Technical Articles 2019, vol. 21(1) ASM International

PhD Dissertation

  • Soumya Mittal, “Learning Enhanced Diagnosis of Logic Circuit Failures”, May 2020 CMU Proquest

Conferences and Journals

  • Soumya Mittal, Szczepan Urban, Kun Young Chung, Jakub Janicki, Wu-Tung Cheng, Martin Parley, Manish Sharma, Shaun Nicholson, “Industry Evaluation of Reversible Scan Chain Diagnosis”, International Test Conference (ITC), 2022 IEEE Xplore Siemens white paper ASM webinar

  • Kun Young Chung, Shaun Nicholson, Soumya Mittal, Martin Parley, Gaurav Veda, Manish Sharma, Matt Knowles, Wu-Tung Cheng, “Improving Diagnosis Resolution with Population Level Statistical Diagnosis”, International Symposium for Testing and Failure Analysis (ISTFA), 2021 ASM International

  • Qicheng Huang, Chenlei Fang, Soumya Mittal, Shawn Blanton, “Towards Smarter Diagnosis: A Learning-based Diagnostic Outcome Previewer”, ACM Transactions on Design Automation of Electronic Systems (TODAES), 2020 ACM

  • Soumya Mittal, Shawn Blanton, “A Deterministic-Statistical Multiple-Defect Diagnosis Methodology”, IEEE VLSI Test Symposium (VTS), 2020 IEEE Xplore

  • Soumya Mittal, Shawn Blanton, “LearnX: A Hybrid Deterministic-Statistical Defect Diagnosis Methodology”, IEEE European Test Symposium (ETS), 2019 IEEE Xplore

  • Chenlei Fang, Qicheng Huang, Soumya Mittal, Shawn Blanton, “Diagnosis Outcome Preview through Learning”, IEEE VLSI Test Symposium (VTS), 2019 IEEE Xplore

  • Qicheng Huang, Chenlei Fang, Soumya Mittal, Shawn Blanton, “Improving Diagnosis Efficiency via Machine Learning”, IEEE International Test Conference (ITC), 2018 IEEE Xplore

  • Soumya Mittal, Shawn Blanton, “NOIDA: Noise-resistant Intra-cell Diagnosis”, IEEE VLSI Test Symposium (VTS), 2018 IEEE Xplore

  • Soumya Mittal, Shawn Blanton, “PADLOC: Physically-Aware Defect Localization and Characterization”, IEEE Asian Test Symposium (ATS), 2017 IEEE Xplore

  • Ben Niewenhuis, Soumya Mittal, Shawn Blanton, “Multiple-defect diagnosis for logic characterization vehicles”, IEEE European Test Symposium (ETS), 2017 IEEE Xplore

  • Phillip Fynan, Zeye Liu, Ben Niewenhuis, Soumya Mittal, Marcin Strojwas, Shawn Blanton, “Logic characterization vehicle design reflection via layout rewiring”, IEEE International Test Conference (ITC), 2016 IEEE Xplore

  • Soumya Mittal, Zeye Liu, Ben Niewenhuis, Shawn Blanton, “Test chip design for optimal cell-aware diagnosability”, IEEE International Test Conference (ITC), 2016 IEEE Xplore

  • Ben Niewenhuis, Zeye Liu, Soumya Mittal, Shawn Blanton, “Logic characterization vehicle design for yield learning”, SEMI Advanced Semiconductor Manufacturing Conference (ASMC), 2016 IEEE Xplore

  • Zeye Liu, Ben Niewenhuis, Soumya Mittal, Shawn Blanton, “Achieving 100% cell-aware coverage by design”, Design, Automation & Test in Europe Conference & Exhibition (DATE), 2016 IEEE Xplore